J/A+A/661/A1 The eFEDS X-ray catalogs (V7.4) (Brunner+, 2022)
The eROSITA Final Equatorial Depth Survey (eFEDS): X-ray catalog.
Brunner H., Liu T., Lamer G., Georgakakis A., Merloni A., Brusa M.,
Bulbul E., Dennerl K., Friedrich S., Liu A., Maitra C., Nandra K.,
Ramos-Ceja M.E., Sanders J.S., Stewart I.M., Boller T., Buchner J.,
Clerc N., Comparat J., Dwelly T., Eckert D., Finoguenov A., Freyberg M.,
Ghirardini V., Gueguen A., Haberl F., Kreykenbohm I., Krumpe M.,
Osterhage S., Pacaud F., Predehl P., Reiprich T.H., Robrade J., Salvato M.,
Santangelo A., Schrabback T., Schwope A., Wilms J.
<Astron. Astrophys. 661, A1 (2022)>
=2022A&A...661A...1B 2022A&A...661A...1B (SIMBAD/NED BibCode)
ADC_Keywords: Surveys ; X-ray sources ; Active gal. nuclei ; Clusters, galaxy ;
QSOs ; Binaries, X-ray
Keywords: catalogues - surveys - X-ray: general
Abstract:
The eROSITA X-ray telescope onboard the Spectrum-Roentgen-Gamma (SRG)
observatory combines a large field of view and a large collecting area
in the energy range between ∼0.2 and ∼8.0 keV with the capability to
perform uniform scanning observations of large sky areas. SRG/eROSITA
performed scanning observations of the ∼140 square degrees eROSITA
Final Equatorial Depth Survey field (the eFEDS field) as part of its
performance verification phase ahead of the planned four years of
all-sky scanning operations. The observing time of eFEDS was chosen to
slightly exceed the depth expected in an equatorial field after the
completion of the all-sky survey. While verifying the capability of
eROSITA to perform large area uniform surveys and serving as a test
and training dataset to establish calibration and data analysis
procedures, the eFEDS survey also constitutes the largest contiguous
soft X-ray survey at this depth to date, supporting a range of early
eROSITA survey science investigations. Here we present a catalogue of
detected X-ray sources in the eFEDS field providing source positions
and extent information, as well as fluxes in multiple energy bands.
The data were fed through a standard data processing pipeline, which
applies X-ray event calibration and provides a set of standard
calibrated data products. A multi-stage source detection procedure,
building in part on experience from XMM-Newton, was optimized and
calibrated by performing realistic simulations of the eROSITA eFEDS
observations. Source fluxes are computed in multiple standard energy
bands, both by forced PSF-fitting and aperture photometry. We
cross-matched the eROSITA eFEDS source catalogue with previous
XMM-ATLAS observations, confirming excellent agreement of the eROSITA
and XMM-ATLAS source fluxes. Astrometric corrections were performed by
cross-matching the eROSITA source positions with an optical reference
catalogue of quasars. We present a primary catalogue of 27910 X-ray
sources (including 542 with significant spatial extent) detected in
the 0.2-2.3keV energy range with detection likelihoods >6,
corresponding to a (point source) flux limit of 6.5*10-15erg/cm2/s
in the 0.5-2.0keV energy band (80% completeness). A supplementary
catalogue contains 4774 low-significance source candidates with
detection likelihoods between 5 and 6. In addition, a hard band sample
of 246 sources detected in the energy range 2.3-5.0keV above a
detection likelihood of 10 is provided. Finally, we provide in
appendix a description of the dedicated data analysis software
package, of the eROSITA calibration database and of the standard
calibrated data products.
Description:
Based on sources detection in the 0.2-2.3keV band using eSASS
adopting a detection likelihood threshold of 5, the sources with
detection likelihood >6 are selected as the main eFEDS catalog (27910
sources), and the less-reliable ones with likelihood <6 are stored in
the supplementary catalog (4774 sources).
Based on sources detection in three bands (1: 0.2-0.6; 2: 0.6-2.3;
3: 2.3-5keV) using eSASS adopting a detection likelihood threshold of
5, we select the sources with a 2.3-5 keV band detection likelihood
≥10 and an extent likelihood =0 as the hard eFEDS catalog (246
sources).
File Summary:
--------------------------------------------------------------------------------
FileName Lrecl Records Explanations
--------------------------------------------------------------------------------
ReadMe 80 . This file
main.dat 1652 27910 eFEDS main X-ray catalog, converted from
eFEDSc001main_V7.4.fits
supp.dat 1652 4774 eFEDS supplementary catalog, converted from
eFEDSc001supp_V7.4.fits
hard.dat 1936 246 eFEDS hard-band selected catalog,
converted from eFEDSc001hard_V7.5.fits)
fits/* . 3 Original catalogs in fits
--------------------------------------------------------------------------------
See also:
J/A+A/661/A2 : Galaxy clusters and groups in eFEDS (Liu+, 2022)
J/A+A/661/A3 : eFEDS counterparts to point-like sources (Salvato+, 2022)
J/A+A/661/A4 : eFEDS optical cluster and group catalog (Klein+, 2022)
J/A+A/661/A5 : The eFEDS AGN catalog (Liu+, 2022)
J/A+A/661/A7 : X-ray properties of eFEDS clusters and groups (Bahar+, 2022)
J/A+A/661/A8 : eFEDS catalogue of variable X-ray sources (Boller+, 2022)
J/A+A/661/A10 : eFEDS galaxy clusters and groups in disguise (Bulbul+, 2022)
J/A+A/661/A23 : Exoplanet X-ray irradiation & evaporation rates (Foster+, 2022)
J/A+A/661/A24 : Corona-chromosphere connection (Fuhrmeister+, 2022)
J/A+A/661/A29 : First eROSITA study of nearby M dwarfs (Magaudda+, 2022)
J/A+A/661/A34 : eta Cha cluster eROSITA X-ray scan (Robrade+, 2022)
J/A+A/661/A35 : eROSITA study of 47 Tuc globular cluster (Saeedi+, 2022)
J/A+A/661/A38 : SRG/ART-XC 1st year all-sky X-ray survey (Pavlinsky+, 2022)
J/A+A/661/A40 : eRASS1 X-ray sources Sco-Cen members (Schmitt+, 2022)
J/A+A/661/A44 : A first eROSITA view of ultracool dwarfs (Stelzer+, 2022)
https://erosita.mpe.mpg.de/edr/eROSITAObservations/Catalogues :
liuT/eFEDScatalogV3.3.html : eFEDS catalog V3.3
Byte-by-byte Description of file: main.dat supp.dat
--------------------------------------------------------------------------------
Bytes Format Units Label Explanations
--------------------------------------------------------------------------------
1- 22 A22 --- Name Source name, eFEDS JHHMMSS.s+DDMMSS
(Name)
24- 28 I5 --- ID-SRC [1/32684] Source ID for main and supp
catalogs(ID_SRC)
30- 35 I6 --- ID-hard ?=-99 Source ID in the eFEDS hard-band
selected catalog (ID_hard)
37- 54 F18.14 deg RAdeg [126.24/145.66] Uncorrected RA (ICRS)
(RA)
56- 73 F18.14 deg DEdeg [-2.95/6.03] Uncorrected Dec (ICRS) (DEC)
75- 83 F9.6 arcsec ePos ?=- Combined positional uncertainty,
uncorrected (RADEC_ERR)
85- 94 F10.6 deg RAcdeg [126.24/145.66] Corrected RA (ICRS)
(RA_CORR)
96- 104 F9.6 deg DEcdeg [-2.95/6.03] Corrected Dec (ICRS)
(DEC_CORR)
106- 114 F9.6 arcsec ePosc Combined positional uncertainty,
corrected (RADECERRCORR)
116- 124 F9.6 arcsec Ext Source extent (EXT)
126- 134 F9.6 arcsec e_Ext ?=- Extent error (EXT_ERR)
136- 145 F10.6 --- ExtLike Extent likelihood (EXT_LIKE)
147- 158 F12.6 --- DetLike Detection likelihood measured by
PSF-fitting (DET_LIKE)
160- 167 F8.6 ct/s MLRate Source count rate measured by
PSF-fitting (ML_RATE)
169- 176 F8.6 ct/s e_MLRate ?=- 1 sigma count rate error
(MLRATEERR)
178- 188 F11.6 ct MLCts Source net counts measured from count
rate (ML_CTS)
190- 199 F10.6 ct e_MLCts ?=- 1 sigma counts error (MLCTSERR)
201- 212 E12.6 mW/m2 MLFlux Source flux converted from count rate
(ML_FLUX)
214- 225 E12.6 mW/m2 e_MLFlux ?=- 1 sigma flux error (MLFLUXERR)
227- 238 E12.6 s MLExp Vignetted exposure value (ML_EXP)
240- 249 F10.6 ct/arcmin2 MLBkg Background at the source position
(ML_BKG)
251 I1 --- inArea90 Whether in the 0.2-2.3keV exp>500s
region, which comprises 90% area
(inArea90)
253- 263 F11.6 --- DetLikeb1 Detection likelihood measured by forced
PSF-fitting; 0.2-0.5keV (DETLIKEb1)
265- 276 F12.6 --- DetLikeb2 Detection likelihood measured by forced
PSF- fitting; 0.5-1keV (DETLIKEb2)
278- 288 F11.6 --- DetLikeb3 Detection likelihood measured by forced
PSF-fitting; 1-2keV (DETLIKEb3)
290- 299 F10.6 --- DetLikeb4 Detection likelihood measured by forced
PSF-fitting; 2-4.5keV (DETLIKEb4)
301- 312 F12.6 --- DetLikes Detection likelihood measured by forced
PSF-fitting; 0.5-2keV (DETLIKEs)
314- 323 F10.6 --- DetLikeh Detection likelihood measured by forced
PSF-fitting; 2.3-5keV (DETLIKEh)
325- 333 F9.6 --- DetLikeu Detection likelihood measured by forced
PSF-fitting; 5-8keV (DETLIKEu)
335- 342 F8.6 ct/s MLRateb1 Source count rate measured by forced
PSF-fitting; .2-.5keV (MLRATEb1)
344- 351 F8.6 ct/s MLRateb2 Source count rate measured by forced
PSF-fitting; 0.5-1keV (MLRATEb2)
353- 360 F8.6 ct/s MLRateb3 Source count rate measured by forced
PSF-fitting; 1-2keV (MLRATEb3)
362- 369 F8.6 ct/s MLRateb4 Source count rate measured by forced
PSF-fitting; 2-4.5keV (MLRATEb4)
371- 378 F8.6 ct/s MLRates Source count rate measured by forced
PSF-fitting; 0.5-2keV (MLRATEs)
380- 387 F8.6 ct/s MLRateh Source count rate measured by forced
PSF-fitting; 2.3-5keV (MLRATEh)
389- 396 F8.6 ct/s MLRateu Source count rate measured by forced
PSF-fitting; 5-8keV (MLRATEu)
398- 405 F8.6 ct/s s_MLRateb1 1 sigma count rate error; 0.2-0.5keV
(MLRATEERR_b1)
407- 414 F8.6 ct/s s_MLRateb2 1 sigma count rate error; 0.5-1keV
(MLRATEERR_b2)
416- 423 F8.6 ct/s s_MLRateb3 1 sigma count rate error; 1-2keV
(MLRATEERR_b3)
425- 432 F8.6 ct/s s_MLRateb4 1 sigma count rate error; 2-4.5keV
(MLRATEERR_b4)
434- 441 F8.6 ct/s s_MLRates 1 sigma count rate error; 0.5-2keV
(MLRATEERR_s)
443- 450 F8.6 ct/s s_MLRateh 1 sigma count rate error; 2.3-5keV
(MLRATEERR_h)
452- 459 F8.6 ct/s s_MLRateu 1 sigma count rate error; 5-8keV
(MLRATEERR_u)
461- 468 F8.6 ct/s e_MLRateb1 1 sigma lower error of count rate;
0.2-0.5keV (MLRATELOWERR_b1)
470- 477 F8.6 ct/s e_MLRateb2 1 sigma lower error of count rate;
0.5-1keV (MLRATELOWERR_b2)
479- 486 F8.6 ct/s e_MLRateb3 1 sigma lower error of count rate;
1-2keV (MLRATELOWERR_b3)
488- 495 F8.6 ct/s e_MLRateb4 1 sigma lower error of count rate;
2-4.5keV (MLRATELOWERR_b4)
497- 504 F8.6 ct/s e_MLRates 1 sigma lower error of count rate;
0.5-2keV (MLRATELOWERR_s)
506- 513 F8.6 ct/s e_MLRateh 1 sigma lower error of count rate;
2.3-5keV (MLRATELOWERR_h)
515- 522 F8.6 ct/s e_MLRateu 1 sigma lower error of count rate;
5-8keV (MLRATELOWERR_u)
524- 531 F8.6 ct/s E_MLRateb1 1 sigma upper error of count rate;
0.2-0.5keV (MLRATEUPERR_b1)
533- 540 F8.6 ct/s E_MLRateb2 1 sigma upper error of count rate;
0.5-1keV (MLRATEUPERR_b2)
542- 549 F8.6 ct/s E_MLRateb3 1 sigma upper error of count rate;
1-2keV (MLRATEUPERR_b3)
551- 558 F8.6 ct/s E_MLRateb4 1 sigma upper error of count rate;
2-4.5keV (MLRATEUPERR_b4)
560- 567 F8.6 ct/s E_MLRates 1 sigma upper error of count rate;
0.5-2keV (MLRATEUPERR_s)
569- 576 F8.6 ct/s E_MLRateh 1 sigma upper error of count rate;
2.3-5keV (MLRATEUPERR_h)
578- 585 F8.6 ct/s E_MLRateu 1 sigma upper error of count rate;
5-8keV (MLRATEUPERR_u)
587- 597 F11.6 ct MLCtsb1 Source net counts measured from count
rate; 0.2-0.5keV (MLCTSb1)
599- 609 F11.6 ct MLCtsb2 Source net counts measured from count
rate; 0.5-1keV (MLCTSb2)
611- 621 F11.6 ct MLCtsb3 Source net counts measured from count
rate; 1-2keV (MLCTSb3)
623- 632 F10.6 ct MLCtsb4 Source net counts measured from count
rate; 2-4.5keV (MLCTSb4)
634- 644 F11.6 ct MLCtss Source net counts measured from count
rate; 0.5-2keV (MLCTSs)
646- 655 F10.6 ct MLCtsh Source net counts measured from count
rate; 2.3-5keV (MLCTSh)
657- 665 F9.6 ct MLCtsu Source net counts measured from count
rate; 5-8keV (MLCTSu)
667- 675 F9.6 ct s_MLCtsb1 1 sigma counts error; 0.2-0.5keV
(MLCTSERR_b1)
677- 685 F9.6 ct s_MLCtsb2 1 sigma counts error; 0.5-1keV
(MLCTSERR_b2)
687- 695 F9.6 ct s_MLCtsb3 1 sigma counts error; 1-2keV
(MLCTSERR_b3)
697- 705 F9.6 ct s_MLCtsb4 1 sigma counts error; 2-4.5keV
(MLCTSERR_b4)
707- 715 F9.6 ct s_MLCtss 1 sigma counts error; 0.5-2keV
(MLCTSERR_s)
717- 725 F9.6 ct s_MLCtsh 1 sigma counts error; 2.3-5keV
(MLCTSERR_h)
727- 735 F9.6 ct s_MLCtsu 1 sigma counts error; 5-8keV
(MLCTSERR_u)
737- 745 F9.6 ct e_MLCtsb1 1 sigma lower error of counts;0.2-0.5keV
(MLCTSLOWERR_b1)
747- 755 F9.6 ct e_MLCtsb2 1 sigma lower error of counts;0.5-1keV
(MLCTSLOWERR_b2)
757- 765 F9.6 ct e_MLCtsb3 1 sigma lower error of counts;1-2keV
(MLCTSLOWERR_b3)
767- 775 F9.6 ct e_MLCtsb4 1 sigma lower error of counts;2-4.5keV
(MLCTSLOWERR_b4)
777- 785 F9.6 ct e_MLCtss 1 sigma lower error of counts;0.5-2keV
(MLCTSLOWERR_s)
787- 795 F9.6 ct e_MLCtsh 1 sigma lower error of counts;2.3-5keV
(MLCTSLOWERR_h)
797- 805 F9.6 ct e_MLCtsu 1 sigma lower error of counts;5-8keV
(MLCTSLOWERR_u)
807- 815 F9.6 ct E_MLCtsb1 1 sigma upper error of counts;0.2-0.5keV
(MLCTSUPERR_b1)
817- 825 F9.6 ct E_MLCtsb2 1 sigma upper error of counts;0.5-1keV
(MLCTSUPERR_b2)
827- 835 F9.6 ct E_MLCtsb3 1 sigma upper error of counts;1-2keV
(MLCTSUPERR_b3)
837- 845 F9.6 ct E_MLCtsb4 1 sigma upper error of counts;2-4.5keV
(MLCTSUPERR_b4)
847- 855 F9.6 ct E_MLCtss 1 sigma upper error of counts;0.5-2keV
(MLCTSUPERR_s)
857- 865 F9.6 ct E_MLCtsh 1 sigma upper error of counts;2.3-5keV
(MLCTSUPERR_h)
867- 875 F9.6 ct E_MLCtsu 1 sigma upper error of counts;5-8keV
(MLCTSUPERR_u)
877- 888 E12.6 mW/m2 MLFluxb1 Source flux converted from count rate;
0.2-0.5keV (MLFLUXb1)
890- 901 E12.6 mW/m2 MLFluxb2 Source flux converted from count rate;
0.5-1keV (MLFLUXb2)
903- 914 E12.6 mW/m2 MLFluxb3 Source flux converted from count rate;
1-2keV (MLFLUXb3)
916- 927 E12.6 mW/m2 MLFluxb4 Source flux converted from count rate;
2-4.5keV (MLFLUXb4)
929- 940 E12.6 mW/m2 MLFluxs Source flux converted from count rate;
0.5-2keV (MLFLUXs)
942- 953 E12.6 mW/m2 MLFluxh Source flux converted from count rate;
2.3-5keV (MLFLUXh)
955- 966 E12.6 mW/m2 MLFluxu Source flux converted from count rate;
5-8keV (MLFLUXu)
968- 979 E12.6 mW/m2 s_MLFluxb1 [0.0/0.01] 1 sigma flux error;
0.2-0.5keV (MLFLUXERR_b1)
981- 992 E12.6 mW/m2 s_MLFluxb2 [0.0/0.01] 1 sigma flux error;
0.5-1keV (MLFLUXERR_b2)
994-1005 E12.6 mW/m2 s_MLFluxb3 [0.0/0.01] 1 sigma flux error;
1-2keV (MLFLUXERR_b3)
1007-1018 E12.6 mW/m2 s_MLFluxb4 [0.0/0.01] 1 sigma flux error;
2-4.5keV (MLFLUXERR_b4)
1020-1031 E12.6 mW/m2 s_MLFluxs [0.0/0.01] 1 sigma flux error;
0.5-2keV (MLFLUXERR_s)
1033-1044 E12.6 mW/m2 s_MLFluxh [0.0/0.01] 1 sigma flux error;
2.3-5keV (MLFLUXERR_h)
1046-1057 E12.6 mW/m2 s_MLFluxu [0.0/0.01] 1 sigma flux error;
5-8keV (MLFLUXERR_u)
1059-1070 E12.6 mW/m2 e_MLFluxb1 1 sigma lower error of flux;
0.2-0.5keV (MLFLUXLOWERR_b1)
1072-1083 E12.6 mW/m2 e_MLFluxb2 1 sigma lower error of flux;
0.5-1keV (MLFLUXLOWERR_b2)
1085-1096 E12.6 mW/m2 e_MLFluxb3 1 sigma lower error of flux;
1-2keV (MLFLUXLOWERR_b3)
1098-1109 E12.6 mW/m2 e_MLFluxb4 1 sigma lower error of flux;
2-4.5keV (MLFLUXLOWERR_b4)
1111-1122 E12.6 mW/m2 e_MLFluxs 1 sigma lower error of flux;
0.5-2keV (MLFLUXLOWERR_s)
1124-1135 E12.6 mW/m2 e_MLFluxh 1 sigma lower error of flux;
2.3-5keV (MLFLUXLOWERR_h)
1137-1148 E12.6 mW/m2 e_MLFluxu 1 sigma lower error of flux;
5-8keV (MLFLUXLOWERR_u)
1150-1161 E12.6 mW/m2 E_MLFluxb1 [0.0/0.01] 1 sigma upper error of flux;
0.2-0.5keV (MLFLUXUPERR_b1)
1163-1174 E12.6 mW/m2 E_MLFluxb2 [0.0/0.01] 1 sigma upper error of flux;
0.5-1keV (MLFLUXUPERR_b2)
1176-1187 E12.6 mW/m2 E_MLFluxb3 [0.0/0.01] 1 sigma upper error of flux;
1-2keV (MLFLUXUPERR_b3)
1189-1200 E12.6 mW/m2 E_MLFluxb4 [0.0/0.01] 1 sigma upper error of flux;
2-4.5keV (MLFLUXUPERR_b4)
1202-1213 E12.6 mW/m2 E_MLFluxs [0.0/0.01] 1 sigma upper error of flux;
0.5-2keV (MLFLUXUPERR_s)
1215-1226 E12.6 mW/m2 E_MLFluxh [0.0/0.01] 1 sigma upper error of flux;
2.3-5keV (MLFLUXUPERR_h)
1228-1239 E12.6 mW/m2 E_MLFluxu [0.0/0.01] 1 sigma upper error of flux;
5-8keV (MLFLUXUPERR_u)
1241-1247 F7.2 s MLExpb1 Vignetted exposure value;
0.2-0.5keV (MLEXPb1)
1249-1255 F7.2 s MLExpb2 Vignetted exposure value;
0.5-1keV (MLEXPb2)
1257-1263 F7.2 s MLExpb3 Vignetted exposure value;
1-2keV (MLEXPb3)
1265-1271 F7.2 s MLExpb4 Vignetted exposure value;
2-4.5keV (MLEXPb4)
1273-1279 F7.2 s MLExps [36.49/3314.72] Vignetted exposure value;
0.5-2keV (MLEXPs)
1281-1287 F7.2 s MLExph Vignetted exposure value;
2.3-5keV (MLEXPh)
1289-1295 F7.2 s MLExpu Vignetted exposure value;
5-8keV (MLEXPu)
1297-1305 F9.6 ct/arcmin2 MLBkgb1 Background at the source position;
0.2-0.5keV (MLBKGb1)
1307-1315 F9.6 ct/arcmin2 MLBkgb2 Background at the source position;
0.5-1keV (MLBKGb2)
1317-1325 F9.6 ct/arcmin2 MLBkgb3 Background at the source position;
1-2keV (MLBKGb3)
1327-1335 F9.6 ct/arcmin2 MLBkgb4 Background at the source position;
2-4.5keV (MLBKGb4)
1337-1346 F10.6 ct/arcmin2 MLBkgs Background at the source position;
0.5-2keV (MLBKGs)
1348-1356 F9.6 ct/arcmin2 MLBkgh Background at the source position;
2.3-5keV (MLBKGh)
1358-1366 F9.6 ct/arcmin2 MLBkgu Background at the source position;
5-8keV (MLBKGu)
1368-1371 I4 ct ApCtsb1 Total counts extracted within the
aperture; 0.2-0.5keV (APECTSb1)
1373-1376 I4 ct ApCtsb2 Total counts extracted within the
aperture; 0.5-1keV (APECTSb2)
1378-1380 I3 ct ApCtsb3 Total counts extracted within the
aperture; 1-2keV (APECTSb3)
1382-1384 I3 ct ApCtsb4 Total counts extracted within the
aperture; 2-4.5keV (APECTSb4)
1386-1389 I4 ct ApCtss Total counts extracted within the
aperture; 0.5-2keV (APECTSs)
1391-1392 I2 ct ApCtsh Total counts extracted within the
aperture; 2.3-5keV (APECTSh)
1394-1395 I2 ct ApCtsu Total counts extracted within the
aperture; 5-8keV (APECTSu)
1397-1403 F7.2 s ApExpb1 [31.31/3393.24] Vignetted exposure value;
0.2-0.5keV (APEEXPb1)
1405-1411 F7.2 s ApExpb2 [28.12/3353.79] Vignetted exposure value;
0.5-1keV (APEEXPb2)
1413-1419 F7.2 s ApExpb3 [29.29/3304.8] Vignetted exposure value;
1-2keV (APEEXPb3)
1421-1427 F7.2 s ApExpb4 [22.35/2952.79] Vignetted exposure value;
2-4.5keV (APEEXPb4)
1429-1435 F7.2 s ApExps [26.97/3314.72] Vignetted exposure value;
0.5-2keV (APEEXPs)
1437-1443 F7.2 s ApExph [20.81/2873.35] Vignetted exposure value;
2.3-5keV (APEEXPh)
1445-1451 F7.2 s ApExpu [13.71/2497.99] Vignetted exposure value;
5-8keV (APEEXPu)
1453-1460 F8.6 ct ApBkgb1 [0.0/2.67] Background counts in the
aperture excluding nearby sources;
0.2-.5keV (APEBKGb1)
1462-1469 F8.6 ct ApBkgb2 [0.0/2.72] Background counts in the
aperture excluding nearby sources;
0.5-1keV (APEBKGb2)
1471-1478 F8.6 ct ApBkgb3 [0.0/2.47] Background counts in the
aperture excluding nearby sources;
1-2keV (APEBKGb3)
1480-1487 F8.6 ct ApBkgb4 [0.0/5.97] Background counts in the
aperture excluding nearby sources;
2-4.5keV (APEBKGb4)
1489-1496 F8.6 ct ApBkgs [0.0/4.95] Background counts in the
aperture excluding nearby sources;
0.5-2keV (APEBKGs)
1498-1505 F8.6 ct ApBkgh [0.0/5.94] Background counts in the
aperture excluding nearby sources;
2.3-5keV (APEBKGh)
1507-1515 F9.6 ct ApBkgu [0.0/14.86] Background counts in the
aperture excluding nearby sources;
5-8keV (APEBKGu)
1517-1524 F8.6 pix ApRadb1 [0.41/9.15] Aperture radius;
0.2-0.5keV (APERADIUSb1)
1526-1533 F8.6 pix ApRadb2 [0.43/9.45] Aperture radius;
0.5-1keV (APERADIUSb2)
1535-1543 F9.6 pix ApRadb3 [0.46/10.1] Aperture radius;
1-2keV (APERADIUSb3)
1545-1553 F9.6 pix ApRadb4 [0.54/14.86] Aperture radius;
2-4.5keV (APERADIUSb4)
1555-1562 F8.6 pix ApRads [0.45/9.87] Aperture radius;
0.5-2keV (APERADIUSs)
1564-1572 F9.6 pix ApRadh [0.56/15.48] Aperture radius;
2.3-5keV (APERADIUSh)
1574-1582 F9.6 pix ApRadu [0.71/27.23] Aperture radius;
5-8keV (APERADIUSu)
1584-1592 F9.6 pix ApPoisb1 ?=-9.99 [0/0.93] Poisson probability of
being background fluctuation;
0.2-0.5keV (APEPOISb1)
1594-1602 F9.6 pix ApPoisb2 ?=-9.99 [0/0.84] Poisson probability of
being background fluctuation; 0.5-1keV
(APEPOISb2)
1604-1612 F9.6 pix ApPoisb3 ?=-9.99 [0/0.83] Poisson probability of
being background fluctuation; 1-2keV
(APEPOISb3)
1614-1622 F9.6 pix ApPoisb4 ?=-9.99 [0/1.0] Poisson probability of
being background fluctuation; 2-4.5keV
(APEPOISb4)
1624-1632 F9.6 pix ApPoiss ?=-9.99 [0/0.94] Poisson probability of
being background fluctuation; 0.5-2keV
(APEPOISs)
1634-1642 F9.6 pix ApPoish ?=-9.99 [0/1.0] Poisson probability of
being background fluctuation; 2.3-5keV
(APEPOISh)
1644-1652 F9.6 pix ApPoisu ?=-9.99 [0/1.0] Poisson probability of
being background fluctuation; 5-8keV
(APEPOISu)
------------------------------------------------------------------------------
Byte-by-byte Description of file: hard.dat
--------------------------------------------------------------------------------
Bytes Format Units Label Explanations
--------------------------------------------------------------------------------
1- 22 A22 --- Name Source name, eFEDS JHHMMSS.s+DDMMSS
(Name)
24- 28 I5 --- ID-SRC [1/28075] Source ID for hard catalog
(ID_SRC)
30- 35 I6 --- ID-main ?=-99 Source ID in the single-band
detected, eFEDS main catalog (ID_main)
37- 54 F18.14 deg RAdeg [127.17/145.14] Uncorrected RA (ICRS)
(RA)
56- 73 F18.14 deg DEdeg [-2.49/5.63] Uncorrected Dec (ICRS)
(DEC)
75- 82 F8.6 arcsec ePos ?=- Combined positional uncertainty,
uncorrected (RADEC_ERR)
84- 93 F10.6 deg RAcdeg Corrected RA (ICRS) (RA_CORR)
95- 103 F9.6 deg DEcdeg Corrected Dec (ICRS) (DEC_CORR)
105- 112 F8.6 arcsec ePosC Combined positional uncertainty,
corrected (RADECERRCORR)
114- 121 F8.6 arcsec Ext Source extent (EXT)
123- 131 F9.6 arcsec e_Ext Extent error (EXT_ERR)
133- 141 F9.6 --- ExtLike Extent likelihood (EXT_LIKE)
143- 154 F12.6 --- DetLike0 Detection likelihood measured by
PSF-fitting (DETLIKE0)
156- 163 F8.6 ct/s MLRate0 Source count rate (MLRATE0)
165- 172 F8.6 ct/s e_MLRate0 ?=- 1 sigma count rate error
(MLRATEERR_0)
174- 184 F11.6 ct MLCts0 Source net counts, combining 3 bands
(MLCTS0)
186- 195 F10.6 ct e_MLCts0 ?=- 1 sigma counts error (MLCTSERR_0)
197- 208 E12.6 mW/m2 MLFlux0 Source flux (MLFLUX0)
210- 221 E12.6 mW/m2 e_MLFlux0 ?=- 1 sigma flux error (MLFLUXERR_0)
223- 231 F9.6 ct/arcmin2 MLBkg0 Background flux at the source position
(MLBKG0)
233 I1 --- inArea90 True if in the 0.2-2.3keV exp>500s
region, which comprises 90% area
(inArea90)
235- 246 F12.6 --- DetLike1 Detection likelihood measured by
PSF-fitting (DETLIKE1)
248- 259 F12.6 --- DetLike2 Detection likelihood measured by
PSF-fitting (DETLIKE2)
261- 270 F10.6 --- DetLike3 Detection likelihood measured by
PSF-fitting (DETLIKE3)
272- 279 F8.6 ct/s MLRate1 Source count rate measured by
PSF-fitting (MLRATE1)
281- 288 F8.6 ct/s MLRate2 Source count rate measured by
PSF-fitting (MLRATE2)
290- 297 F8.6 ct/s MLRate3 Source count rate measured by
PSF-fitting (MLRATE3)
299- 306 F8.6 ct/s s_MLRate1 ?=- 1 sigma count rate error
(MLRATEERR_1)
308- 315 F8.6 ct/s s_MLRate2 ?=- 1 sigma count rate error
(MLRATEERR_2)
317- 324 F8.6 ct/s s_MLRate3 ?=- 1 sigma count rate error
(MLRATEERR_3)
326- 336 F11.6 ct MLCts1 Source net counts measured from count
rate (MLCTS1)
338- 348 F11.6 ct MLCts2 Source net counts measured from count
rate (MLCTS2)
350- 359 F10.6 ct MLCts3 Source net counts measured from count
rate (MLCTS3)
361- 369 F9.6 ct s_MLCts1 ?=- 1 sigma counts error (MLCTSERR_1)
371- 380 F10.6 ct s_MLCts2 ?=- 1 sigma counts error (MLCTSERR_2)
382- 390 F9.6 ct s_MLCts3 ?=- 1 sigma counts error (MLCTSERR_3)
392- 403 E12.6 mW/m2 MLFlux1 Source flux converted from count rate
(MLFLUX1)
405- 416 E12.6 mW/m2 MLFlux2 Source flux converted from count rate
(MLFLUX2)
418- 429 E12.6 mW/m2 MLFlux3 Source flux converted from count rate
(MLFLUX3)
431- 442 E12.6 mW/m2 s_MLFlux1 ?=- 1 sigma flux error (MLFLUXERR_1)
444- 455 E12.6 mW/m2 s_MLFlux2 ?=- 1 sigma flux error (MLFLUXERR_2)
457- 468 E12.6 mW/m2 s_MLFlux3 ?=- 1 sigma flux error (MLFLUXERR_3)
470- 481 F12.6 s MLExp1 Vignetted exposure value (MLEXP1)
483- 493 F11.6 s MLExp2 Vignetted exposure value (MLEXP2)
495- 505 F11.6 s MLExp3 Vignetted exposure value (MLEXP3)
507- 514 F8.6 ct/arcmin2 MLBkg1 Background flux at the source position
(MLBKG1)
516- 524 F9.6 ct/arcmin2 MLBkg2 Background flux at the source position
(MLBKG2)
526- 533 F8.6 ct/arcmin2 MLBkg3 Background flux at the source position
(MLBKG3)
535- 546 F12.6 --- DetLikeb1 Detection likelihood measured by forced
PSF-fitting; 0.2-0.5keV (DETLIKEb1)
548- 559 F12.6 --- DetLikeb2 Detection likelihood measured by forced
PSF-fitting; 0.5-1keV (DETLIKEb2)
561- 572 F12.6 --- DetLikeb3 Detection likelihood measured by forced
PSF-fitting; 1-2keV (DETLIKEb3)
574- 583 F10.6 --- DetLikeb4 Detection likelihood measured by forced
PSF-fitting; 2-4.5keV (DETLIKEb4)
585- 596 F12.6 --- DetLikes Detection likelihood measured by forced
PSF-fitting; 0.5-2keV (DETLIKEs)
598- 607 F10.6 --- DetLikeh Detection likelihood measured by forced
PSF-fitting; 2.3-5keV (DETLIKEh)
609- 617 F9.6 --- DetLikeu Detection likelihood measured by forced
PSF-fitting; 5-8keV (DETLIKEu)
619- 626 F8.6 ct/s MLRateb1 Source count rate measured by forced
PSF-fitting;.2-.5keV (MLRATEb1)
628- 635 F8.6 ct/s MLRateb2 Source count rate measured by forced
PSF-fitting;0.5-1keV (MLRATEb2)
637- 644 F8.6 ct/s MLRateb3 Source count rate measured by forced
PSF-fitting; 1-2keV (MLRATEb3)
646- 653 F8.6 ct/s MLRateb4 Source count rate measured by forced
PSF- fitting;2-4.5keV (MLRATEb4)
655- 662 F8.6 ct/s MLRates Source count rate measured by forced
PSF-fitting;0.5-2keV (MLRATEs)
664- 671 F8.6 ct/s MLRateh Source count rate measured by forced
PSF- fitting;2.3-5keV (MLRATEh)
673- 680 F8.6 ct/s MLRateu Source count rate measured by forced
PSF-fitting; 5-8keV (MLRATEu)
682- 689 F8.6 ct/s s_MLRateb1 1 sigma count rate error; 0.2-0.5keV
(MLRATEERR_b1)
691- 698 F8.6 ct/s s_MLRateb2 1 sigma count rate error; 0.5-1keV
(MLRATEERR_b2)
700- 707 F8.6 ct/s s_MLRateb3 1 sigma count rate error; 1-2keV
(MLRATEERR_b3)
709- 716 F8.6 ct/s s_MLRateb4 1 sigma count rate error; 2-4.5keV
(MLRATEERR_b4)
718- 725 F8.6 ct/s s_MLRates 1 sigma count rate error; 0.5-2keV
(MLRATEERR_s)
727- 734 F8.6 ct/s s_MLRateh 1 sigma count rate error; 2.3-5keV
(MLRATEERR_h)
736- 743 F8.6 ct/s s_MLRateu 1 sigma count rate error; 5-8keV
(MLRATEERR_u)
745- 752 F8.6 ct/s e_MLRateb1 1 sigma lower error of count rate;
0.2-0.5keV (MLRATELOWERR_b1)
754- 761 F8.6 ct/s e_MLRateb2 1 sigma lower error of count rate;
0.5-1keV (MLRATELOWERR_b2)
763- 770 F8.6 ct/s e_MLRateb3 1 sigma lower error of count rate;
1-2keV (MLRATELOWERR_b3)
772- 779 F8.6 ct/s e_MLRateb4 1 sigma lower error of count rate;
2-4.5keV (MLRATELOWERR_b4)
781- 788 F8.6 ct/s e_MLRates 1 sigma lower error of count rate;
0.5-2keV (MLRATELOWERR_s)
790- 797 F8.6 ct/s e_MLRateh 1 sigma lower error of count rate;
2.3-5keV (MLRATELOWERR_h)
799- 806 F8.6 ct/s e_MLRateu 1 sigma lower error of count rate;
5-8keV (MLRATELOWERR_u)
808- 815 F8.6 ct/s E_MLRateb1 1 sigma upper error of count rate;
0.2-0.5keV (MLRATEUPERR_b1)
817- 824 F8.6 ct/s E_MLRateb2 1 sigma upper error of count rate;
0.5-1keV (MLRATEUPERR_b2)
826- 833 F8.6 ct/s E_MLRateb3 1 sigma upper error of count rate;
1-2keV (MLRATEUPERR_b3)
835- 842 F8.6 ct/s E_MLRateb4 1 sigma upper error of count rate;
2-4.5keV (MLRATEUPERR_b4)
844- 851 F8.6 ct/s E_MLRates 1 sigma upper error of count rate;
0.5-2keV (MLRATEUPERR_s)
853- 860 F8.6 ct/s E_MLRateh 1 sigma upper error of count rate;
2.3-5keV (MLRATEUPERR_h)
862- 869 F8.6 ct/s E_MLRateu 1 sigma upper error of count rate;
5-8keV (MLRATEUPERR_u)
871- 881 F11.6 ct MLCtsb1 Source net counts measured from count
rate; 0.2-0.5keV (MLCTSb1)
883- 893 F11.6 ct MLCtsb2 Source net counts measured from count
rate; 0.5-1keV (MLCTSb2)
895- 905 F11.6 ct MLCtsb3 Source net counts measured from count
rate; 1-2keV (MLCTSb3)
907- 916 F10.6 ct MLCtsb4 Source net counts measured from count
rate; 2-4.5keV (MLCTSb4)
918- 928 F11.6 ct MLCtss Source net counts measured from count
rate; 0.5-2keV (MLCTSs)
930- 939 F10.6 ct MLCtsh Source net counts measured from count
rate; 2.3-5keV (MLCTSh)
941- 949 F9.6 ct MLCtsu Source net counts measured from count
rate; 5-8keV (MLCTSu)
951- 959 F9.6 ct s_MLCtsb1 1 sigma counts error; 0.2-0.5keV
(MLCTSERR_b1)
961- 969 F9.6 ct s_MLCtsb2 1 sigma counts error; 0.5-1keV
(MLCTSERR_b2)
971- 979 F9.6 ct s_MLCtsb3 1 sigma counts error; 1-2keV
(MLCTSERR_b3)
981- 989 F9.6 ct s_MLCtsb4 1 sigma counts error; 2-4.5keV
(MLCTSERR_b4)
991- 999 F9.6 ct s_MLCtss 1 sigma counts error; 0.5-2keV
(MLCTSERR_s)
1001-1009 F9.6 ct s_MLCtsh 1 sigma counts error; 2.3-5keV
(MLCTSERR_h)
1011-1019 F9.6 ct s_MLCtsu 1 sigma counts error; 5-8keV
(MLCTSERR_u)
1021-1029 F9.6 ct e_MLCtsb1 1 sigma lower error of counts;
0.2-0.5keV (MLCTSLOWERR_b1)
1031-1039 F9.6 ct e_MLCtsb2 1 sigma lower error of counts;
0.5-1keV (MLCTSLOWERR_b2)
1041-1049 F9.6 ct e_MLCtsb3 1 sigma lower error of counts;
1-2keV (MLCTSLOWERR_b3)
1051-1059 F9.6 ct e_MLCtsb4 1 sigma lower error of counts;
2-4.5keV (MLCTSLOWERR_b4)
1061-1069 F9.6 ct e_MLCtss 1 sigma lower error of counts;
0.5-2keV (MLCTSLOWERR_s)
1071-1079 F9.6 ct e_MLCtsh 1 sigma lower error of counts;
2.3-5keV (MLCTSLOWERR_h)
1081-1089 F9.6 ct e_MLCtsu 1 sigma lower error of counts;
5-8keV (MLCTSLOWERR_u)
1091-1099 F9.6 ct E_MLCtsb1 1 sigma upper error of counts;
0.2-0.5keV (MLCTSUPERR_b1)
1101-1109 F9.6 ct E_MLCtsb2 1 sigma upper error of counts;
0.5-1keV (MLCTSUPERR_b2)
1111-1119 F9.6 ct E_MLCtsb3 1 sigma upper error of counts;
1-2keV (MLCTSUPERR_b3)
1121-1129 F9.6 ct E_MLCtsb4 1 sigma upper error of counts;
2-4.5keV (MLCTSUPERR_b4)
1131-1139 F9.6 ct E_MLCtss 1 sigma upper error of counts;
0.5-2keV (MLCTSUPERR_s)
1141-1149 F9.6 ct E_MLCtsh 1 sigma upper error of counts;
2.3-5keV (MLCTSUPERR_h)
1151-1158 F8.6 ct E_MLCtsu 1 sigma upper error of counts;
5-8keV (MLCTSUPERR_u)
1160-1171 E12.6 mW/m2 MLFluxb1 Source flux converted from count rate;
0.2-0.5keV (MLFLUXb1)
1173-1184 E12.6 mW/m2 MLFluxb2 Source flux converted from count rate;
0.5-1keV (MLFLUXb2)
1186-1197 E12.6 mW/m2 MLFluxb3 Source flux converted from count rate;
1-2keV (MLFLUXb3)
1199-1210 E12.6 mW/m2 MLFluxb4 Source flux converted from count rate;
2-4.5keV (MLFLUXb4)
1212-1223 E12.6 mW/m2 MLFluxs Source flux converted from count rate;
0.5-2keV (MLFLUXs)
1225-1236 E12.6 mW/m2 MLFluxh Source flux converted from count rate;
2.3-5keV (MLFLUXh)
1238-1249 E12.6 mW/m2 MLFluxu Source flux converted from count rate;
5-8keV (MLFLUXu)
1251-1262 E12.6 mW/m2 s_MLFluxb1 1 sigma flux error; 0.2-0.5keV
(MLFLUXERR_b1)
1264-1275 E12.6 mW/m2 s_MLFluxb2 1 sigma flux error; 0.5-1keV
(MLFLUXERR_b2)
1277-1288 E12.6 mW/m2 s_MLFluxb3 1 sigma flux error; 1-2keV
(MLFLUXERR_b3)
1290-1301 E12.6 mW/m2 s_MLFluxb4 1 sigma flux error; 2-4.5keV
(MLFLUXERR_b4)
1303-1314 E12.6 mW/m2 s_MLFluxs 1 sigma flux error; 0.5-2keV
(MLFLUXERR_s)
1316-1327 E12.6 mW/m2 s_MLFluxh 1 sigma flux error; 2.3-5keV
(MLFLUXERR_h)
1329-1340 E12.6 mW/m2 s_MLFluxu 1 sigma flux error; 5-8keV
(MLFLUXERR_u)
1342-1353 E12.6 mW/m2 e_MLFluxb1 1 sigma lower error of flux;
0.2-0.5keV (MLFLUXLOWERR_b1)
1355-1366 E12.6 mW/m2 e_MLFluxb2 1 sigma lower error of flux;
0.5-1keV (MLFLUXLOWERR_b2)
1368-1379 E12.6 mW/m2 e_MLFluxb3 1 sigma lower error of flux;
1-2keV (MLFLUXLOWERR_b3)
1381-1392 E12.6 mW/m2 e_MLFluxb4 1 sigma lower error of flux;
2-4.5keV (MLFLUXLOWERR_b4)
1394-1405 E12.6 mW/m2 e_MLFluxs 1 sigma lower error of flux;
0.5-2keV (MLFLUXLOWERR_s)
1407-1418 E12.6 mW/m2 e_MLFluxh 1 sigma lower error of flux;
2.3-5keV (MLFLUXLOWERR_h)
1420-1431 E12.6 mW/m2 e_MLFluxu 1 sigma lower error of flux;
5-8keV (MLFLUXLOWERR_u)
1433-1444 E12.6 mW/m2 E_MLFluxb1 1 sigma upper error of flux;
0.2-0.5keV (MLFLUXUPERR_b1)
1446-1457 E12.6 mW/m2 E_MLFluxb2 1 sigma upper error of flux;
0.5-1keV (MLFLUXUPERR_b2)
1459-1470 E12.6 mW/m2 E_MLFluxb3 1 sigma upper error of flux;
1-2keV (MLFLUXUPERR_b3)
1472-1483 E12.6 mW/m2 E_MLFluxb4 1 sigma upper error of flux;
2-4.5keV (MLFLUXUPERR_b4)
1485-1496 E12.6 mW/m2 E_MLFluxs 1 sigma upper error of flux;
0.5-2keV (MLFLUXUPERR_s)
1498-1509 E12.6 mW/m2 E_MLFluxh 1 sigma upper error of flux;
2.3-5keV (MLFLUXUPERR_h)
1511-1522 E12.6 mW/m2 E_MLFluxu 1 sigma upper error of flux;
5-8keV (MLFLUXUPERR_u)
1524-1530 F7.2 s MLExpb1 Vignetted exposure value;
0.2-0.5keV (MLEXPb1)
1532-1538 F7.2 s MLExpb2 Vignetted exposure value;
0.5-1keV (MLEXPb2)
1540-1546 F7.2 s MLExpb3 Vignetted exposure value;
1-2keV (MLEXPb3)
1548-1554 F7.2 s MLExpb4 Vignetted exposure value;
2-4.5keV (MLEXPb4)
1556-1562 F7.2 s MLExps Vignetted exposure value;
0.5-2keV (MLEXPs)
1564-1570 F7.2 s MLExph Vignetted exposure value;
2.3-5keV (MLEXPh)
1572-1578 F7.2 s MLExpu Vignetted exposure value;
5-8keV (MLEXPu)
1580-1589 F10.6 ct/arcmin2 MLBkgb1 Background flux at the source position;
0.2-0.5keV (MLBKGb1)
1591-1600 F10.6 ct/arcmin2 MLBkgb2 Background flux at the source position;
0.5-1keV (MLBKGb2)
1602-1611 F10.6 ct/arcmin2 MLBkgb3 Background flux at the source position;
1-2keV (MLBKGb3)
1613-1621 F9.6 ct/arcmin2 MLBkgb4 Background flux at the source position;
2-4.5keV (MLBKGb4)
1623-1632 F10.6 ct/arcmin2 MLBkgs Background flux at the source position;
0.5-2keV (MLBKGs)
1634-1642 F9.6 ct/arcmin2 MLBkgh Background flux at the source position;
2.3-5keV (MLBKGh)
1644-1651 F8.6 ct/arcmin2 MLBkgu Background flux at the source position;
5-8keV (MLBKGu)
1653-1656 I4 ct ApCtsb1 Total counts extracted in the aperture;
0.2-0.5keV (APECTSb1)
1658-1661 I4 ct ApCtsb2 Total counts extracted in the aperture;
0.5-1keV (APECTSb2)
1663-1665 I3 ct ApCtsb3 Total counts extracted in the aperture;
1-2keV (APECTSb3)
1667-1669 I3 ct ApCtsb4 Total counts extracted in the aperture;
2-4.5keV (APECTSb4)
1671-1674 I4 ct ApCtss Total counts extracted in the aperture;
0.5-2keV (APECTSs)
1676-1677 I2 ct ApCtsh Total counts extracted in the aperture;
2.3-5keV (APECTSh)
1679-1680 I2 ct ApCtsu Total counts extracted in the aperture;
5-8keV (APECTSu)
1682-1688 F7.2 s ApExPb1 Vignetted exposure value;
0.2-0.5keV (APEEXPb1)
1690-1696 F7.2 s ApExPb2 Vignetted exposure value;
0.5-1keV (APEEXPb2)
1698-1704 F7.2 s ApExPb3 Vignetted exposure value;
1-2keV (APEEXPb3)
1706-1712 F7.2 s ApExPb4 Vignetted exposure value;
2-4.5keV (APEEXPb4)
1714-1720 F7.2 s ApExPs Vignetted exposure value;
0.5-2keV (APEEXPs)
1722-1728 F7.2 s ApExPh Vignetted exposure value;
2.3-5keV (APEEXPh)
1730-1736 F7.2 s ApExPu Vignetted exposure value;
5-8keV (APEEXPu)
1738-1745 F8.6 ct ApBkgb1 Background counts in the aperture,
excluding nearby sources; 0.2-0.5keV
(APEBKGb1)
1747-1754 F8.6 ct ApBkgb2 Background counts in the aperture,
excluding nearby sources; 0.5-1keV
(APEBKGb2)
1756-1763 F8.6 ct ApBkgb3 Background counts in the aperture,
excluding nearby sources; 1-2keV
(APEBKGb3)
1765-1772 F8.6 ct ApBkgb4 Background counts in the aperture,
excluding nearby sources; 2-4.5keV
(APEBKGb4)
1774-1781 F8.6 ct ApBkgs Background counts in the aperture,
excluding nearby sources; 0.5-2keV
(APEBKGs)
1783-1790 F8.6 ct ApBkgh Background counts in the aperture,
excluding nearby sources; 2.3-5keV
(APEBKGh)
1792-1800 F9.6 ct ApBkgu Background counts in the aperture,
excluding nearby sources; 5-8keV
(APEBKGu)
1802-1809 F8.6 pix ApRadb1 Aperture radius; 0.2-0.5keV
(APERADIUSb1)
1811-1818 F8.6 pix ApRadb2 Aperture radius; 0.5-1keV
(APERADIUSb2)
1820-1827 F8.6 pix ApRadb3 Aperture radius; 1-2keV
(APERADIUSb3)
1829-1837 F9.6 pix ApRadb4 Aperture radius; 2-4.5keV
(APERADIUSb4)
1839-1846 F8.6 pix ApRads Aperture radius; 0.5-2keV
(APERADIUSs)
1848-1856 F9.6 pix ApRadh Aperture radius; 2.3-5keV
(APERADIUSh)
1858-1866 F9.6 pix ApRadu Aperture radius; 5-8keV
(APERADIUSu)
1868-1876 F9.6 --- ApPoisb1 ?=-9.99 Poisson probability of being
background fluctuation; 0.2-0.5keV
(APEPOISb1)
1878-1886 F9.6 --- ApPoisb2 ?=-9.99 Poisson probability of being
background fluctuation; 0.5-1keV
(APEPOISb2)
1888-1896 F9.6 --- ApPoisb3 ?=-9.99 Poisson probability of being
background fluctuation; 1-2keV
(APEPOISb3)
1898-1906 F9.6 --- ApPoisb4 ?=-9.99 Poisson probability of being
background fluctuation; 2-4.5keV
(APEPOISb4)
1908-1916 F9.6 --- ApPoiss ?=-9.99 Poisson probability of being
background fluctuation; 0.5-2keV
(APEPOISs)
1918-1926 F9.6 --- ApPoish ?=-9.99 Poisson probability of being
background fluctuation; 2.3-5keV
(APEPOISh)
1928-1936 F9.6 --- ApPoisu ?=-9.99 Poisson probability of being
background fluctuation; 5-8keV
(APEPOISu)
--------------------------------------------------------------------------------
History:
From Teng Liu, liu(at)mpe.mpg.de
Acknowledgements:
This work is based on data from eROSITA, the soft X-ray instrument
aboard SRG, a joint Russian-German science mission supported by the
Russian Space Agency (Roskosmos), in the interests of the Russian
Academy of Sciences represented by its Space Research Institute (IKI),
and the Deutsches Zentrum fur Luft- und Raumfahrt (DLR). The SRG
spacecraft was built by Lavochkin Association (NPOL) and its
subcontractors, and is operated by NPOL with support from the Max
Planck Institute for Extraterrestrial Physics (MPE). The development
and construction of the eROSITA X-ray instrument was led by MPE, with
contributions from the Dr. Karl Remeis Observatory Bamberg & ECAP (FAU
Erlangen-Nuernberg), the University of Hamburg Observatory, the
Leibniz Institute for Astrophysics Potsdam (AIP), and the Institute
for Astronomy and Astrophysics of the University of Tubingen, with
the support of DLR and the Max Planck Society. The Argelander
Institute for Astronomy of the University of Bonn and the Ludwig
Maximilians Universitat Munich also participated in the science
preparation for eROSITA. The eROSITA data shown here were processed
using the eSASS software system developed by the German eROSITA
consortium.
References:
The Early Data Release of eROSITA and Mikhail Pavlinsky ART-XC on the
SRG mission, 2022, A&A, 661, A1-A46
(End) Patricia Vannier [CDS] 14-Mar-2022